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interfacial layer width, σ S

in thin films
The characteristic length defined by the variance of the Gaussian function fitted to the gradient of the electron density profile established by X-ray specular reflectivity studies of the liquid interface.
Source:
PAC, 1994, 66, 1667 (Thin films including layers: terminology in relation to their preparation and characterization (IUPAC Recommendations 1994)) on page 1674
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IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8. doi:10.1351/goldbook.
Last update: 2014-02-24; version: 2.3.3.
DOI of this term: doi:10.1351/goldbook.I03086.
Original PDF version: http://www.iupac.org/goldbook/I03086.pdf. The PDF version is out of date and is provided for reference purposes only. For some entries, the PDF version may be unavailable.
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