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in situ micro-X-ray diffraction (Kossel-technique)

Any technique which utilizes the diffraction of X-rays generated in a microstructural domain of a solid under bombardment with a finely focused electron beam, thus providing an X-ray diffraction pattern of this microstructural domain. The pattern can be recorded with a film either on the reflection or transmission side of the specimen (in the latter case the crystalline sample has to be a thin film or a small particle).
PAC, 1983, 55, 2023 (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2025
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IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8.
Last update: 2014-02-24; version: 2.3.3.
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