Any technique which utilizes the diffraction
of X-rays generated in a microstructural domain of a solid under bombardment with
a finely focused electron beam, thus providing an X-ray diffraction
pattern of this microstructural domain. The pattern can be recorded with a film
either on the reflection or transmission
side of the specimen (in the latter case the crystalline sample has to be a thin film
or a small particle).
PAC, 1983, 55, 2023
(Nomenclature, symbols and units recommended for in situ microanalysis (Provisional))
on page 2025
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by
A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997).
XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic,
J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8. https://doi.org/10.1351/goldbook