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reflection high energy electron diffraction (RHEED)

Any technique which measures the angular intensity distribution of electrons 'reflected' from a crystalline surface under bombardment with high energy electrons near grazing incidence. The diffraction pattern provides very surface sensitive information (information depth 1 nm) on the atomic arrangement of the top layers of a solid.
PAC, 1983, 55, 2023 (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2025
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IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8.
Last update: 2014-02-24; version: 2.3.3.
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