Goldbook title
IUPAC > Gold Book > alphabetical index > S > secondary electron yield in in situ microanalysis
Gold G Icon
Indexes Download

secondary electron yield

in in situ microanalysis
The number of secondary electrons generated per primary electron for a given specimen and experimental conditions. It depends on the (mean) atomic number of the excited area of the sample, the angle between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
Source:
PAC, 1983, 55, 2023 (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026
Interactive Link Maps
First Level Second Level Third Level
Cite as:
IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: http://goldbook.iupac.org (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8. doi:10.1351/goldbook.
Last update: 2014-02-24; version: 2.3.3.
DOI of this term: doi:10.1351/goldbook.S05519.
Original PDF version: http://www.iupac.org/goldbook/S05519.pdf. The PDF version is out of date and is provided for reference purposes only. For some entries, the PDF version may be unavailable.
Current PDF version | Version for print | History of this term
picture