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secondary electron yield

in in situ microanalysis
The number of secondary electrons generated per primary electron for a given specimen and experimental conditions. It depends on the (mean) atomic number of the excited area of the sample, the angle between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
PAC, 1983, 55, 2023 (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026
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IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997). XML on-line corrected version: (2006-) created by M. Nic, J. Jirat, B. Kosata; updates compiled by A. Jenkins. ISBN 0-9678550-9-8.
Last update: 2014-02-24; version: 2.3.3.
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