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Entries from:

PAC, 1983, 55, 2023. Nomenclature, symbols and units recommended for in situ microanalysis (Provisional), doi:10.1351/pac198355122023


absorbed electron coefficient in in situ microanalysis
absorbed electrons in in situ microanalysis
acceleration energy in in situ microanalysis
Auger electron spectroscopy
back scatter coefficient in in situ microanalysis
back scattered electrons (BSEs) in in situ microanalysis
beam current in in situ microanalysis
beam diameter in in situ microanalysis
critical excitation energy, E q in in situ microanalysis
electron microscopy
electron probe microanalysis (EPMA)
electron probe X-ray microanalysis (EPXMA)
excitation energy in in situ microanalysis
high resolution energy loss spectroscopy (HRELS)
in situ micro-X-ray diffraction (Kossel-technique)
in situ microanalysis
inner orbital X-ray emission spectra
ion probe microanalysis (IPMA)
lateral resolution in in situ microanalysis
low energy electron diffraction (LEED)
primary electrons (pe) in in situ microanalysis
reflection electron energy loss spectroscopy (REELS)
reflection high energy electron diffraction (RHEED)
scanning electron microscopy (SEM)
scanning transmission electron microscopy (STEM)
secondary electron yield in in situ microanalysis
secondary electrons (se) in in situ microanalysis
transmission electron energy loss spectroscopy (TEELS)
transmission electron microscopy (TEM)