in situ micro-X-ray diffraction (Kossel-technique)
Any technique which utilizes the diffraction of X-rays generated in a microstructural domain of a solid under bombardment with a finely focused electron beam, thus providing an X-ray diffraction pattern of this microstructural domain. The pattern can be recorded with a film either on the reflection or transmission side of the specimen (in the latter case the crystalline sample has to be a thin film or a small particle).
PAC, 1983, 55, 2023. 'Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)' on page 2025 (