secondary ionization

in mass spectrometry
The process in which ions are ejected from a sample surface (which may be a solid or substrate dissolved in a solvent matrix) as a result of bombardment by a primary beam of atoms or ions.
PAC, 1991, 63, 1541. 'Recommendations for nomenclature and symbolism for mass spectroscopy (including an appendix of terms used in vacuum technology). (Recommendations 1991)' on page 1548 (