secondary electron yield

in in situ microanalysis
The number of @[email protected] generated per @[email protected] for a given specimen and experimental conditions. It depends on the (mean) @[email protected] of the excited area of the sample, the @[email protected] between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026 [Terms] [Paper]