secondary electron yield

in in situ microanalysis
https://doi.org/10.1351/goldbook.S05519
The number of @S05518@ generated per @P04829@ for a given specimen and experimental conditions. It depends on the (mean) @A00499@ of the excited area of the sample, the @A00346@ between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
Source:
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026 [Terms] [Paper]
Cite as: IUPAC. Compendium of Chemical Terminology, 2nd ed. (the "Gold Book"). Compiled by A. D. McNaught and A. Wilkinson. Blackwell Scientific Publications, Oxford (1997). Online version (2019-) created by S. J. Chalk. ISBN 0-9678550-9-8. https://doi.org/10.1351/goldbook.
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Last revised: February 24, 2014