secondary electron yield

in in situ microanalysis
https://doi.org/10.1351/goldbook.S05519
The number of @[email protected] generated per @[email protected] for a given specimen and experimental conditions. It depends on the (mean) @[email protected] of the excited area of the sample, the @[email protected] between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
Source:
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026 [Terms] [Paper]